1. The total number of multiple stuck-at faults possible in a 3-input NAND gate is. a) 27 b) 81 c) 80 d) None of the above Solu...
CMOS Interview Questions Part 3
1. In complementary CMOS the Number of transistor required to implement an N fan-in gate is. a) 2N b) 2N+1 c) N d) None of the abo...
CMOS Fabrication Process
CMOS Structure: P-well and N-well structure Twin tub/well technology In case of a p-well technology in early 1960s, doping co...
Process-Voltage-Temperature(PVT) Variation
PVT is abbreviation for Process, Voltage and Temperature. Process Process variation is the deviation in attributes of transistor during t...
OCV,AOCV and POCV
During fabrication the chips on the same die may suffer from variations due to process, voltage or temperature change, thus transistors ca...
Signal Integrity
Signal integrity Signal integrity is the ability of an electrical signal to carry information reliably and resist the effects of high fr...
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